Gessertshausen, Germany

Georg Ortler


 

Average Co-Inventor Count = 1.7

ph-index = 3

Forward Citations = 26(Granted Patents)


Location History:

  • Gessertshausen, DE (2003 - 2015)
  • Geesertshausen, DE (2020)

Company Filing History:


Years Active: 2003-2020

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8 patents (USPTO):Explore Patents

Title: Georg Ortler: Innovator in Frequency-Converting Devices

Introduction

Georg Ortler is a notable inventor based in Gessertshausen, Germany. He has made significant contributions to the field of frequency-converting devices, holding a total of 8 patents. His work focuses on improving the accuracy and efficiency of measurement systems.

Latest Patents

Ortler's latest patents include a method and system for determining scattering coefficients of a frequency-converting device under test. This innovative system utilizes a network analyzer to identify and correct system errors that occur between the device under test and the analyzer. By measuring incoming and outgoing signals at individual ports, the system adjusts for errors and accurately determines scattering parameters. Another notable patent involves a synthesizer that provides adjustable, stable, and reproducible phase and frequency. This measuring device generates signals of known phase ratios, which serve as reference signals for controlling oscillators.

Career Highlights

Throughout his career, Georg Ortler has worked with prominent companies such as Rohde & Schwarz GmbH & Co. KG. His expertise in frequency-converting devices has positioned him as a key figure in the industry, contributing to advancements in measurement technology.

Collaborations

Ortler has collaborated with talented individuals in his field, including Christian Evers and Markus Freidhof. These partnerships have fostered innovation and the development of cutting-edge technologies.

Conclusion

Georg Ortler's contributions to the field of frequency-converting devices and his impressive portfolio of patents highlight his role as a leading inventor. His work continues to influence advancements in measurement systems and technology.

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