The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Jun. 19, 2006
Applicants:

Christian Evers, Kirchheim, DE;

Thilo Bednorz, Erding, DE;

Georg Ortler, Gessertshausen, DE;

Inventors:

Christian Evers, Kirchheim, DE;

Thilo Bednorz, Erding, DE;

Georg Ortler, Gessertshausen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 25/00 (2006.01); H03D 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for operating a measuring device, in particular, a vectorial network analyzer, which can be connected via at least two ports to a device under test, with excitation units assigned to each port, wherein each excitation unit provides a signal generator, with which the assigned port can be supplied with an excitation signal, provides the following procedural stages: a measurement at measuring positions of the actual phase offset between the excitation signals output at the ports; and a variation of the frequency of at least one of the two signal generators during a correction interval so that a specified set phase offset is achieved at reference positions between the excitation signals output at the ports.


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