The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Oct. 10, 2013
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Andreas Paech, Munich, DE;

Georg Ortler, Geesertshausen, DE;

Steffen Neidhardt, Dorfen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
G01R 27/28 (2013.01);
Abstract

A system for determining scattering parameters of a frequency-converting device under test using a network analyzer determines the system errors which occur between the individual ports () of the frequency-converting device under test () and the ports () of the network analyzer () connected to the ports () of the frequency-converting device under test () and measures the system-error-containing signals incoming and outgoing in each case at the individual ports () of the frequency-converting device under test (). Following this, system-error-adjusted signals incoming and outgoing in each case at the individual ports () of the frequency-converting device under test () are determined by weighting the system-error-containing signals incoming and outgoing in each case at the individual ports () of the frequency-converting device under test () with the associated, determined system errors, and the scattering parameters of the frequency-converting device under test () are determined from the system-error-adjusted signals incoming and outgoing in each case at the individual ports () of the frequency-converting device under test (). The phase of the signal to be measured exciting, in each case, a port () of the frequency-converting device under test () is initialized in an identical manner in every measurement.


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