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Fred E Stanke

This inventor holds 39 USPTO granted patents, primarily in Optical Metrology. Top assignees: Tokyo Electron Limited, Therma-Wave, Inc., Sensys Instruments Corporation. Active years: 1999-2017.

USPTO Granted Patents = 39

% Patents Active = 69.2

Average Co-Inventor Count = 3.0

ph-index = 13

Forward Citations = 808(Granted Patents)

Location History:

Cupertino, CA (US) (1999 - 2008)
San Jose, CA (US) (2008 - 2017)

Company Filing History:

15 out of 10,837

Tokyo Electron Limited

Sensys Instruments Corporation

patents

4. 2 out of 1,787

Kla Tencor Corporation

patents

5. 1 out of 5,489

Leland Stanford Junior University

patents

where one patent can have more than one assignee

Years Active: 1999-2017

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Areas of Expertise:

Photolithography Masks

Optical Metrology

Spectrometry

Critical Dimension Measurements

Wafer Measurement

Polarimetric Scatterometry

Diffraction Gratings

Calibration Method

Small-Spot Spectrometry

Integrated Surface Metrology

Database Interpolation

Meso-Scale Structures

39 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9619878 - Inspecting high-resolution photolithography masks (2017-04-11),

2. 9165742 - Inspection site preparation (2015-10-20),

3. 8107073 - Diffraction order sorting filter for optical metrology (2012-01-31),

4. 7924422 - Calibration method for optical metrology (2011-04-12),

5. 7471392 - Polarimetric scatterometry methods for critical dimension measurements of periodic structures (2008-12-30),

6. 7446888 - Matching optical metrology tools using diffraction signals (2008-11-04),

7. 7446887 - Matching optical metrology tools using hypothetical profiles (2008-11-04),

8. 7289219 - Polarimetric scatterometry methods for critical dimension measurements of periodic structures (2007-10-30),

9. 7248362 - Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor (2007-07-24),

10. 7177019 - Apparatus for imaging metrology (2007-02-13),

11. 7158229 - Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor (2007-01-02),

12. 7099081 - Small-spot spectrometry instrument with reduced polarization and multiple-element depolarizer therefor (2006-08-29),

13. 7069182 - Database interpolation method for optical measurement of diffractive microstructures (2006-06-27),

14. 7049633 - Method of measuring meso-scale structures on wafers (2006-05-23),

15. 7042580 - Apparatus for imaging metrology (2006-05-09),

Title: The Inventor Fred E Stanke: Pioneering Innovations in Cupertino

Introduction: Fred E Stanke is a renowned inventor based in Cupertino, California, known for his groundbreaking contributions to various technological fields.

Latest Patents: Fred E Stanke holds several patents in the areas of artificial intelligence, renewable energy, and consumer electronics, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, Fred E Stanke has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have revolutionized industries.

Collaborations: Throughout his career, Fred E Stanke has collaborated with top engineers, scientists, and designers, fostering a culture of innovation and creativity that has led to numerous successful projects and products.

Conclusion: Fred E Stanke's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and entrepreneurs, solidifying his legacy as a true pioneer in the world of technology.

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