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Wappingers Falls, NY, United States of America

Franz X Zach

USPTO Granted Patents = 13

Average Co-Inventor Count = 1.7

ph-index = 5

Forward Citations = 95(Granted Patents)

Company Filing History:

11 out of 164,197

International Business Machines Corporation

Infineon Technologies North America Corp.

1 out of 14,724

Infineon Technologies Ag

4. 1 out of 832,843

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patents

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Years Active: 2000-2011

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7923786 - Selective silicon-on-insulator isolation structure and method (2011-04-12),

2. 7861209 - Method for interlayer and yield based optical proximity correction (2010-12-28),

3. 7712069 - Method for interlayer and yield based optical proximity correction (2010-05-04),

4. 7334212 - Method for interlayer and yield based optical proximity correction (2008-02-19),

5. 7326983 - Selective silicon-on-insulator isolation structure and method (2008-02-05),

6. 7124396 - Alternating phase-shift mask rule compliant IC design (2006-10-17),

7. 6961920 - Method for interlayer and yield based optical proximity correction (2005-11-01),

8. 6936522 - Selective silicon-on-insulator isolation structure and method (2005-08-30),

9. 6927172 - Process to suppress lithography at a wafer edge (2005-08-09),

10. 6485894 - Method to self-align a lithographic pattern to a workpiece (2002-11-26),

11. 6270947 - Method and apparatus for reducing non-uniformity area effects in the manufacture of semiconductor devices (2001-08-07),

12. 6204187 - Contact and deep trench patterning (2001-03-20),

13. 6132940 - Method for producing constant profile sidewalls (2000-10-17),

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