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For the Inventor, By the Inventor

Villach, Austria

Erwin Thalmann

This inventor holds 18 USPTO granted patents, primarily in Semiconductor Testing. Top assignee: Infineon Technologies Ag. Active years: 2005-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Erwin Thalmann. Retrieved from https://idiyas.com/inventor/erwin-thalmann

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 18

% Patents Active = 22.2

Average Co-Inventor Count = 1.6

ph-index = 3

Forward Citations = 29(Granted Patents)


Location History:

  • München, DE (2005)
  • Müchen, DE (2007)
  • Munich, DE (2005 - 2008)
  • Villach, AT (2006 - 2008)
  • Gundersheim, AT (2016 - 2018)

Company Filing History:

goldMedal18 out of 15,040 
 
Infineon Technologies Ag
 patents

Years Active: 2005-2018

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Areas of Expertise:
Semiconductor Dies
Data Processing Circuit
Memory Units
Digital Circuit
Monitoring Device
Electronic Circuit
Integrated Memory
Sense Amplifier
Test Apparatus
Calibration Apparatus
Redundant Design
Majority Decisions
18 patents (USPTO):Explore Patents
1. 10018667 - Method for testing semiconductor dies (2018-07-10),
2. 9435849 - Method for testing semiconductor dies and a test apparatus (2016-09-06),
3. 7353425 - Data processing circuit apparatus having a data transmission unit of redundant design (2008-04-01),
4. 7343532 - Testing memory units in a digital circuit (2008-03-11),
5. 7340313 - Monitoring device for monitoring internal signals during initialization of an electronic circuit (2008-03-04),
6. 7321497 - Electronic circuit apparatus and method for stacking electronic circuit units (2008-01-22),
7. 7308622 - Integrated memory and method for testing the memory (2007-12-11),
8. 7292479 - Memory device with multistage sense amplifier (2007-11-06),
9. 7276896 - Test apparatus and method for testing circuit units to be tested (2007-10-02),
10. 7254758 - Method and apparatus for testing circuit units to be tested with different test mode data sets (2007-08-07),
11. 7228477 - Apparatus and method for testing circuit units to be tested (2007-06-05),
12. 7191085 - Method for testing an electric circuit (2007-03-13),
13. 7188291 - Circuit and method for testing a circuit having memory array and addressing and control unit (2007-03-06),
14. 7184335 - Electronic memory apparatus, and method for deactivating redundant bit lines or word lines (2007-02-27),
15. 7143325 - Method for testing circuit units to be tested by means of majority decisions and test device for performing the method (2006-11-28),

Title: Erwin Thalmann: Innovator in Semiconductor Testing

Introduction

Erwin Thalmann is a notable inventor based in Villach, Austria. He has made significant contributions to the field of semiconductor technology, holding a total of 18 patents. His work focuses on methods for testing semiconductor dies, which are crucial for ensuring the reliability and performance of electronic devices.

Latest Patents

Thalmann's latest patents include innovative methods for testing semiconductor dies. One such method involves providing a test apparatus and an electrically conductive carrier. The process includes using a semiconductor substrate with multiple semiconductor dies, each equipped with contact elements. The semiconductor substrate is placed on the carrier, and the testing is conducted by connecting the test apparatus to the contact elements of the semiconductor dies. This method enhances the efficiency and accuracy of semiconductor testing.

Career Highlights

Throughout his career, Erwin Thalmann has worked with prominent companies in the semiconductor industry, including Infineon Technologies AG. His expertise in semiconductor technology has positioned him as a key figure in the development of testing methodologies that improve product quality and reliability.

Collaborations

Thalmann has collaborated with several professionals in his field, including Sven Boldt and Thomas Grebner. These collaborations have contributed to the advancement of semiconductor testing techniques and have fostered innovation within the industry.

Conclusion

Erwin Thalmann's contributions to semiconductor testing are invaluable, as evidenced by his numerous patents and collaborations. His work continues to influence the field, ensuring that electronic devices meet the highest standards of performance and reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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