The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Aug. 12, 2004
Erwin Thalmann, Villach, AT;
Erwin Thalmann, Villach, AT;
Infineon Technologies AG, Munich, DE;
Abstract
Apparatus and Method for Testing Circuit Units To Be Tested. According to one aspect, a test apparatus for testing circuit units to be tested, includes a nominal data production unit for production of a nominal data stream, a comparison device for comparison of an actual data stream which is emitted from the circuit unit to be tested as a function of the nominal data stream that is supplied with the nominal data stream; and a compression device for compression of an intermediate result signal which is emitted from the comparison device as a function of the comparison into a test result signal, with the intermediate result signal () which is emitted from the comparison device being temporarily stored in a buffer storage device with the intermediate result signal which is temporarily stored in a buffer storage device being read by means of a read unit.