The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2006
Filed:
Oct. 01, 2004
Erwin Thalmann, Villach, AT;
Erwin Thalmann, Villach, AT;
Infineon Technologies AG, Munich, DE;
Abstract
The invention provides a test device for testing circuit units () to be tested, having connecting units () for connecting the circuit units () to be tested to the test device, a test system () and an output unit () for outputting test result data, the test device having a determining unit () for determining those of the measurement data () which correspond for a predeterminable number of circuit units () to be tested, and for defining the corresponding measurement data () as the expected data (); and comparison units () for comparing the measurement data () generated by the circuit units () to be tested in a manner dependent on the test data () written in with the expected data () in order to obtain comparison data ().