The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2007

Filed:

Jun. 06, 2005
Applicants:

Manfred Moser, Dachau, DE;

Daniel Mysliwitz, Munich, DE;

Erwin Thalmann, Villach, AT;

Inventors:

Manfred Moser, Dachau, DE;

Daniel Mysliwitz, Munich, DE;

Erwin Thalmann, Villach, AT;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a test apparatus for testing a circuit unit () to be tested having a test system (), a control bus () for transferring control data (), an address bus () for transferring addressing data () and a data bus () for exchanging test data () between the test system () and the circuit unit () to be tested. A voltage generating device () connected between the test system () and the circuit unit () to be tested serves for generating a predeterminable operating voltage output signal (-) for the voltage supply of the circuit unit () to be tested in a manner dependent on a control signal () that is provided by the test system () and fed via the control bus ().


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