Growing community of inventors

Villach, Austria

Erwin Thalmann

Average Co-Inventor Count = 1.60

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 29

Erwin ThalmannSven Boldt (4 patents)Erwin ThalmannMartin Versen (2 patents)Erwin ThalmannStefan Kramp (2 patents)Erwin ThalmannManfred Moser (2 patents)Erwin ThalmannMichael Leutschacher (2 patents)Erwin ThalmannThomas Grebner (2 patents)Erwin ThalmannChristian Musshoff (2 patents)Erwin ThalmannMichael Schittenhelm (1 patent)Erwin ThalmannDaniel Mysliwitz (1 patent)Erwin ThalmannHans-Christoph Ostendorf (1 patent)Erwin ThalmannThomas Neyer (1 patent)Erwin ThalmannErwin Thalmann (18 patents)Sven BoldtSven Boldt (10 patents)Martin VersenMartin Versen (17 patents)Stefan KrampStefan Kramp (13 patents)Manfred MoserManfred Moser (6 patents)Michael LeutschacherMichael Leutschacher (4 patents)Thomas GrebnerThomas Grebner (3 patents)Christian MusshoffChristian Musshoff (3 patents)Michael SchittenhelmMichael Schittenhelm (16 patents)Daniel MysliwitzDaniel Mysliwitz (4 patents)Hans-Christoph OstendorfHans-Christoph Ostendorf (3 patents)Thomas NeyerThomas Neyer (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Infineon Technologies Ag (18 from 14,724 patents)


18 patents:

1. 10018667 - Method for testing semiconductor dies

2. 9435849 - Method for testing semiconductor dies and a test apparatus

3. 7353425 - Data processing circuit apparatus having a data transmission unit of redundant design

4. 7343532 - Testing memory units in a digital circuit

5. 7340313 - Monitoring device for monitoring internal signals during initialization of an electronic circuit

6. 7321497 - Electronic circuit apparatus and method for stacking electronic circuit units

7. 7308622 - Integrated memory and method for testing the memory

8. 7292479 - Memory device with multistage sense amplifier

9. 7276896 - Test apparatus and method for testing circuit units to be tested

10. 7254758 - Method and apparatus for testing circuit units to be tested with different test mode data sets

11. 7228477 - Apparatus and method for testing circuit units to be tested

12. 7191085 - Method for testing an electric circuit

13. 7188291 - Circuit and method for testing a circuit having memory array and addressing and control unit

14. 7184335 - Electronic memory apparatus, and method for deactivating redundant bit lines or word lines

15. 7143325 - Method for testing circuit units to be tested by means of majority decisions and test device for performing the method

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12/26/2025
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