Location History:
- Seattle, WA (US) (2012 - 2017)
- Kirkland, WA (US) (2017 - 2021)
Company Filing History:
6 out of 1,622 
3 out of 8 
1 out of 1 Years Active: 2012-2021
Title: The Innovative Journey of Eric Yeh-Wei Tseo
Introduction
Eric Yeh-Wei Tseo is a distinguished inventor based in Kirkland, WA, USA, recognized for his significant contributions to the field of coordinate measurement machines (CMM). With a total of six patents to his name, Tseo’s work combines ingenuity with practical applications, enhancing the capabilities of modern inspection systems.
Latest Patents
Among Tseo’s latest innovations is a patented system designed to improve user interaction with CMMs through a context-sensitive relational feature and measurement command menu. This system features a comprehensive user interface that allows operators to edit inspection plans effectively with the aid of a three-dimensional (3D) simulation. The context-sensitive menu tailors available commands based on selected geometric features, streamlining the planning process for workpiece inspections.
Another notable patent addresses the creation of an inspection program editing environment that incorporates user-defined collision avoidance volumes. This innovation enables users to position auxiliary volumes in the 3D view without requiring a complete physical model in the CAD file, thus preventing potential collisions during inspection operations.
Career Highlights
Eric Tseo has gained valuable experience working with prominent organizations in the industry, including Mitutoyo Corporation and Mitutoyo Europe GmbH. His tenure at these companies has allowed him to leverage his expertise in developing advanced technological solutions for measurement and inspection challenges.
Collaborations
Throughout his career, Tseo has collaborated with skilled professionals such as Dahai Yu and Bart De Vlieghere. These collaborations have contributed to the refinement and successful implementation of his innovative ideas and patents.
Conclusion
Eric Yeh-Wei Tseo continues to be a key player in the innovations surrounding coordinate measurement technology. His patents not only showcase his creativity and technical prowess but also provide valuable tools for enhancing the efficiency of workpiece inspections. Tseo’s contributions pave the way for future advancements in this crucial field.