The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Mar. 22, 2010
Eric Yeh-wei Tseo, Seattle, WA (US);
Dahai Yu, Redmond, WA (US);
Ryan Northrup, Renton, WA (US);
Mitutoyo Corporation, Kawasaki-shi, JP;
Abstract
A method is provided for programming step and repeat operations of a machine vision inspection system. The machine vision inspection system includes an imaging portion, a stage for holding one or more workpieces in a field of view (FOV) of the imaging portion, a control portion, and a graphical user interface (GUI). According to the method, a user operates the machine vision inspection system to define a set of inspection operations to be performed on a first configuration of workpiece features. The user also operates the GUI to display a step and repeat dialog box, in which he defines a first plurality of parameters defining a set of default step and repeat locations for performing the defined set of inspection operations. The user further operates the GUI to define a set of inspection step and repeat locations, which is a subset of the defined set of default step and repeat locations, where the inspection operations are to be actually performed.