The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
May. 04, 2015
Mitutoyo Corporation, Kanagawa-ken, JP;
Mitutoyo Europe Gmbh, Neuss, DE;
Dahai Yu, Redmond, WA (US);
Eric Yeh-Wei Tseo, Kirkland, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Mitutoro Europe GMBH, Neuss, DE;
Abstract
A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (CAD) file processing portion and a user interface comprising a 3D view, and editable plan representation. Both the 3D view and the editable plan representation are configure to be automatically responsive to operations in a first set of editing operations, regardless of whether the operations are performed in the 3D view or the editable plan representation of the user interface. The first set of editing operations may comprise deleting (or adding) at least one workpiece feature in the 3D view or the editable plan representation of the user interface, for example. Various other portions of the system (e.g. other user interface windows) may also be automatically responsive to the first set of editing operations, regardless of where the editing operations are performed in the user interface.