The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2017
Filed:
Dec. 18, 2013
Mitutoyo Corporation, Kanagawa-ken, JP;
Mitutoyo Europe Gmbh, Neuss, DE;
Eric Yeh-Wei Tseo, Seattle, WA (US);
Dahai Yu, Redmond, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A system and method are provided for programming workpiece feature inspection operations for a coordinate measuring machine. An editing environment is operated to display a 3-dimensional workpiece representation comprising a first surface feature of a workpiece. A first feature surface sampling pattern is created having at least one pattern parameter adjusted to correspond to a first surface feature of the workpiece. A corresponding representation of the sampling pattern includes operative sampling pattern locations located proximate to the first surface feature. User operations in the GUI further adjust pattern parameters of the sampling pattern. The further adjustment of the pattern parameters simultaneously affects a plurality of the sampling pattern locations. The sampling pattern representation may include various types of operative and inoperative sampling pattern locations, which may be displayed in a manner that distinguishes them from one another, such as by being represented with different colors, shapes or patterns.