Growing community of inventors

Kirkland, WA, United States of America

Eric Yeh-Wei Tseo

Average Co-Inventor Count = 2.77

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 31

Eric Yeh-Wei TseoDahai Yu (5 patents)Eric Yeh-Wei TseoBart De Vlieghere (2 patents)Eric Yeh-Wei TseoRyan Northrup (1 patent)Eric Yeh-Wei TseoFrank Uwe Madsen (1 patent)Eric Yeh-Wei TseoSamuel Wu (1 patent)Eric Yeh-Wei TseoTobias Friedrich (1 patent)Eric Yeh-Wei TseoMichael Peter (1 patent)Eric Yeh-Wei TseoBart De Vlieghere (0 patent)Eric Yeh-Wei TseoMichael Peter (0 patent)Eric Yeh-Wei TseoEric Yeh-Wei Tseo (6 patents)Dahai YuDahai Yu (17 patents)Bart De VlieghereBart De Vlieghere (3 patents)Ryan NorthrupRyan Northrup (7 patents)Frank Uwe MadsenFrank Uwe Madsen (2 patents)Samuel WuSamuel Wu (1 patent)Tobias FriedrichTobias Friedrich (1 patent)Michael PeterMichael Peter (1 patent)Bart De VlieghereBart De Vlieghere (0 patent)Michael PeterMichael Peter (0 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Mitutoyo Corporation (6 from 1,622 patents)

2. Mitutoyo Europe Gmbh (3 from 8 patents)

3. Mitutoro Europe Gmbh (1 from 1 patent)


6 patents:

1. 10990075 - Context sensitive relational feature/measurement command menu display in coordinate measurement machine (CMM) user interface

2. 10254113 - Inspection program editing environment providing user defined collision avoidance volumes

3. 9952586 - Inspection program editing environment with simulation status and control continually responsive to selection operations

4. 9646425 - Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portions

5. 9639083 - System and method for programming workpiece feature inspection operations for a coordinate measuring machine

6. 8271895 - GUI for programming step and repeat operations in a machine vision inspection system

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