Company Filing History:

30 out of 164,108

International Business Machines Corporation

patents

1 out of 13,684

Applied Materials, Inc.

patents

where one patent can have more than one assignee

Years Active: 1999-2017

where 'Filed Patents' based on already Granted Patents

30 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 9652729 - Metrology management (2017-05-16),

2. 8855401 - Methods and systems involving measuring complex dimensions of silicon devices (2014-10-07),

3. 8467993 - Measurement tool monitoring using fleet measurement precision and tool matching precision analysis (2013-06-18),

4. 8450120 - SEM repair for sub-optimal features (2013-05-28),

5. 8211717 - SEM repair for sub-optimal features (2012-07-03),

6. 7881891 - Automated dynamic metrology sampling system and method for process control (2011-02-01),

7. 7831395 - Quantification of adsorbed molecular contaminant using thin film measurement (2010-11-09),

8. 7716009 - Metrology tool recipe validator using best known methods (2010-05-11),

9. 7700946 - Structure for reducing prior level edge interference with critical dimension measurement (2010-04-20),

10. 7645620 - Method and structure for reducing prior level edge interference with critical dimension measurement (2010-01-12),

11. 7571070 - Measurement system fleet optimization (2009-08-04),

12. 7532999 - Determining root cause of matching problem and/or fleet measurement precision problem for measurement system (2009-05-12),

13. 7487054 - Automated dynamic metrology sampling system and method for process control (2009-02-03),

14. 7485859 - Charged beam apparatus and method that provide charged beam aerial dimensional map (2009-02-03),

15. 7479396 - Structure, system and method for dimensionally unstable layer dimension measurement (2009-01-20),

Title: Eric Peter Solecky: Innovator in Metrology and Silicon Device Measurement

Introduction

Eric Peter Solecky, based in Hyde Park, NY, is a prolific inventor with an impressive portfolio of 30 patents. His innovative work focuses on enhancing metrology systems and complex dimension measurement for silicon devices, contributing significantly to advancements in technology.

Latest Patents

Among his latest inventions, Solecky has developed a method for metrology management that streamlines the process of managing metrology systems. This method involves receiving parts, identifying their type, retrieving associated test rules and measurement data, and determining if a part should be measured. The processing device then outputs the part accordingly and utilizes a counter to keep track of the number of parts processed.

Another notable patent involves measuring the complex dimensions of silicon devices. This method includes receiving images, applying offset values, and processing the images to identify specific features of interest. By defining exclusion boundaries and measuring distances between these features, Solecky provides a robust technique for measuring silicon devices accurately.

Career Highlights

Solecky has made substantial contributions during his tenure at renowned companies such as IBM and Applied Materials, Inc. His work at these institutions has allowed him to hone his skills and innovate within the field of metrology and silicon technology.

Collaborations

Throughout his career, Solecky has collaborated with various professionals, including Charles Neill Archie and Lin Zhou. These collaborations have played a pivotal role in the development of his inventions, fostering an environment of innovative thinking and technical excellence.

Conclusion

Eric Peter Solecky exemplifies the spirit of innovation through his extensive patent portfolio and significant contributions to metrology and silicon device measurement. His career, marked by collaboration and expertise, continues to inspire advancements in technology and engineering practices.

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