The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
Oct. 29, 2010
Charles N. Archie, Granite Springs, NY (US);
Anastasios A. Katsetos, Poughkeepsie, NY (US);
Eric P. Solecky, Hyde Park, NY (US);
Georgios A. Vakas, New Windsor, NY (US);
Charles N. Archie, Granite Springs, NY (US);
Anastasios A. Katsetos, Poughkeepsie, NY (US);
Eric P. Solecky, Hyde Park, NY (US);
Georgios A. Vakas, New Windsor, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for measuring a dimension of a device includes receiving an image of a portion of the device, receiving a first offset value and a second offset value, processing the image to define a least one graph of a line of pixels, the at least one graph including the brightness level of each pixel in a line of pixels, identifying a location of a first peak and a second peak in the graph, defining a first exclusion area boundary, defining a second exclusion area boundary, setting the brightness level of the pixels between the first exclusion area boundary and the second exclusion area boundary to zero, identifying a first portion of the feature of interest and a second portion of the feature of interest, and measuring a distance between the first portion of the feature of interest and the second portion of the feature of interest.