Erfan Soltanmohammadi

Title: Erfan Soltanmohammadi: Innovator in Semiconductor Inspection Technologies

Introduction

Erfan Soltanmohammadi is a notable inventor based in Campbell, CA (US), recognized for his contributions to semiconductor inspection technologies. With a total of 9 patents to his name, he has made significant advancements in the field, particularly in the areas of noise characteristics and defect segmentation.

Latest Patents

Among his latest patents, one focuses on "Clustering sub-care areas based on noise characteristics." This innovation involves determining a care area in an image of a semiconductor wafer, which is then divided into sub-care areas based on polygon shapes in a design file. A noise scan of a histogram for these sub-care areas is performed, allowing for clustering into groups based on the noise characteristics. Another significant patent is "Unsupervised defect segmentation," which describes an inspection system that receives datasets from a defect inspection system. This system labels inspection datasets with class labels based on their positions in a defined signal space and segments them into defect groups using a trained classifier.

Career Highlights

Erfan has worked with prominent companies in the semiconductor industry, including Kla Tencor Corporation and Kla Corporation. His experience in these organizations has contributed to his expertise in developing innovative solutions for semiconductor inspection.

Collaborations

Throughout his career, Erfan has collaborated with talented individuals such as Martin Plihal and Prasanti Uppaluri. These collaborations have further enriched his work and contributed to the advancements in his field.

Conclusion

Erfan Soltanmohammadi stands out as a key innovator in semiconductor inspection technologies, with a strong portfolio of patents that reflect his expertise and contributions to the industry. His work continues to influence advancements in the field, showcasing the importance of innovation in technology.