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For the Inventor, By the Inventor

Haifa, Israel

Eran Amit

This inventor holds 32 USPTO granted patents and 7 published patent applications and 3 EPO patents, primarily in Metrology Techniques. Top assignees: Kla Tencor Corporation, Kla Corporation, Motionize Israel Ltd.. Active years: 2014-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eran Amit. Retrieved from https://idiyas.com/inventor/eran-amit

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 32 

% Patents Active = 87.5

 

Average Co-Inventor Count = 3.8

ph-index = 5

Forward Citations = 84(Granted Patents)


Location History:

  • Migdal Haemek, IL (2022)
  • Pardes Hanna-Karkur, IL (2014 - 2023)
  • Haifa, IL (2018 - 2023)

Company Filing History:

goldMedal23 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal6 out of 615 
 
Kla Corporation
 patents
bronzeMedal2 out of 4 
 
Motionize Israel Ltd.
 patents
4. 1 out of 834,453 
Other
 patents

Years Active: 2014-2024

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Areas of Expertise:
Metrology Targets
Overlay Measurement
Machine Learning
Scatterometry
Performance Assessment
Quality Metrics
Process Control
Gait Analysis
Lithography Systems
Device Designs
Semiconductor Manufacturing
Imaging Techniques
32 patents (USPTO):Explore Patents
1. 12117347 - Metrology target design for tilted device designs (2024-10-15),
2. 11756687 - Method and system for assessing performance (2023-09-12),
3. 11709433 - Device-like metrology targets (2023-07-25),
4. 11372340 - Method and system for providing a quality metric for improved process control (2022-06-28),
5. 11248905 - Machine learning in metrology measurements (2022-02-15),
6. 11158548 - Overlay measurement using multiple wavelengths (2021-10-26),
7. 11119417 - Single cell grey scatterometry overlay targets and their measurement using varying illumination parameter(s) (2021-09-14),
8. 11085754 - Enhancing metrology target information content (2021-08-10),
9. 11067904 - System for combined imaging and scatterometry metrology (2021-07-20),
10. 11060845 - Polarization measurements of metrology targets and corresponding target designs (2021-07-13),
11. 11054752 - Device metrology targets and methods (2021-07-06),
12. 11006860 - Method and apparatus for gait analysis (2021-05-18),
13. 10763146 - Recipe optimization based zonal analysis (2020-09-01),
14. 10699969 - Quick adjustment of metrology measurement parameters according to process variation (2020-06-30),
15. 10685165 - Metrology using overlay and yield critical patterns (2020-06-16),

Title: The Innovative Mind of Eran Amit

Introduction: Eran Amit, a visionary inventor hailing from Haifa, Israel, is renowned for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Eran Amit's latest patents include cutting-edge advancements in artificial intelligence, renewable energy technologies, and sustainable urban development solutions.

Career Highlights: With a career spanning over two decades, Eran Amit has established himself as a leading figure in the Israeli tech industry. His work has been instrumental in shaping the future of various sectors, from healthcare to transportation.

Collaborations: Eran Amit has collaborated with top research institutions, universities, and tech companies worldwide to bring his innovative ideas to life. His partnerships have led to the development of revolutionary products and services that have impacted millions of lives.

Conclusion: Eran Amit's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and entrepreneurs. His dedication to creating a better world through technology makes him a true pioneer in the field of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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