Emmanuel Jean-Marc Beaurepaire

Title: Emmanuel Jean-Marc Beaurepaire: Innovations in Laser Scanning Microscopy

Introduction

Emmanuel Jean-Marc Beaurepaire is an inventor based in Palaiseau, France. His work includes optical microscopy and methods for acquiring signals in laser-scanning systems. His patent portfolio includes 3 patents.

Latest Patents

**Quantitative nonlinear optical microscopy using a shaped beam.** This invention describes a nonlinear optical microscope that uses a spatial light modulator to shape a pulsed laser beam. The modulator adjusts the beam’s intensity or phase at the objective’s rear pupil, producing a focused beam that extends axially while remaining confined in one or two lateral directions. A detector collects signals from the specimen, and a motorized stage carries the slide within a histology slide scanner assembly.

**Method and device for acquiring signals in laser scanning microscopy.** This invention presents a method for acquiring optical measurement signals as a focused excitation beam follows a predetermined path through an object. The path is selected to reduce changes in the optical properties of the environments crossed between consecutive acquisitions, while at least one acquisition parameter is modulated during the beam’s movement. The patent also describes a device for implementing the method.

Career Highlights

Beaurepaire’s professional affiliations include École Polytechnique and the French National Centre for Scientific Research (CNRS). His patented work addresses techniques for shaping laser beams and improving signal acquisition in microscopy.

Collaborations

His listed coworkers include Nicolas Olivier and Marie-Claire Schanne-Klein. Their names appear alongside Beaurepaire’s work in the context of his professional and research collaborations.

Conclusion

Emmanuel Jean-Marc Beaurepaire’s inventions focus on advancing optical microscopy through shaped-beam techniques and carefully controlled laser-scanning signal acquisition.