The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Dec. 03, 2012
Ecole Polytechnique, Palaiseau, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Marie-Claire Schanne-Klein, Verrieres le Buisson, FR;
Emmanuel Jean-Marc Beaurepaire, Palaiseau, FR;
Mathias Strupler, Montreal, CA;
Delphine Debarre, Paris, FR;
Nicolas Olivier, Belfort, FR;
Pierre Mahou, Bures-sur-Yvette, FR;
ECOLE POLYTECHNIQUE, Palaiseau, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
Abstract
A nonlinear optical microscope is provided, including source of a pulsed laser beam; a spatial light modulator for modulating the spatial profile of the pulsed laser beam; an objective for guiding the modulated beam towards a slide intended to carry a specimen; and a detector for collecting signals originating from the specimen, wherein the spatial light modulator is designed to modulate the intensity and/or the phase of the pulsed laser beam on the rear pupil of the objective to produce a beam that is axially extended and confined in one or two lateral directions after focusing by the objective, and wherein the slide is placed on a motorized stage of a histology slide scanner assembly.