Nicolas Olivier

Title: Nicolas Olivier: Inventor in Optical Microscopy

Introduction

Nicolas Olivier is an inventor based in Paris, France, whose patent work focuses on optical microscopy and methods for acquiring signals from specimens. His listed portfolio includes 3 patents.

Latest Patents

“Quantitative Nonlinear Optical Microscopy Using a Shaped Beam” describes a nonlinear optical microscope that uses a spatial light modulator to shape a pulsed laser beam. The shaped beam is focused onto a specimen, while a detector collects signals from it. The design aims to extend the beam axially while confining it laterally, and is intended for use with a motorized histology slide scanner.

“Method and Device for Acquiring Signals in Laser Scanning Microscopy” concerns a method for collecting optical measurement signals as a focused excitation beam moves along a predetermined path through an object. The path is selected to reduce changes in the optical properties of the environments crossed between consecutive acquisitions, while at least one acquisition parameter is modulated during the beam’s movement. The patent also describes a device for carrying out the method.

Career Highlights

Olivier’s listed professional affiliations include École Polytechnique and the French National Centre for Scientific Research (CNRS). His patent work reflects an emphasis on improving microscopy techniques and optical signal acquisition.

Collaborations

His listed collaborators include Emmanuel Jean-Marc Beaurepaire and Jean-Louis Martin.

Conclusion

Nicolas Olivier’s inventions address beam shaping and signal acquisition in optical microscopy, connecting his research affiliations with practical approaches to imaging and measurement.