The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Feb. 03, 2010
Emmanuel Jean-marc Beaurepaire, Palaiseau, FR;
Israel Veilleux, Quebec, CA;
Nicolas Olivier, Paris, FR;
Delphine Malvina Daniele Marie Debarre, Paris, FR;
Jean-louis Martin, Bures sur Yvette, FR;
Emmanuel Jean-Marc Beaurepaire, Palaiseau, FR;
Israel Veilleux, Quebec, CA;
Nicolas Olivier, Paris, FR;
Delphine Malvina Daniele Marie Debarre, Paris, FR;
Jean-Louis Martin, Bures sur Yvette, FR;
Ecole Polytechnique, Palaiseau, FR;
Abstract
A method for acquiring signals in laser scanning microscopy, includes the steps of: moving a focused optical excitation beam relative to an object to be measured so that the focus point of the beam follows a predetermined path in the space of the object; and acquiring optical measurement signals along the path according to at least one acquisition parameter; characterized in that the path of the excitation beam is determined so as to substantially minimize the variations of the optical properties of at least one portion of the environments crossed by the excitation beam between consecutive acquisitions, and in that at least one acquisition parameter among the acquisition parameters is modulated during the movement of the excitation beam. A device for implementing the method is also described.