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Palaiseau, France

Emmanuel Jean-Marc Beaurepaire

Average Co-Inventor Count = 5.29

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 5

Emmanuel Jean-Marc BeaurepaireNicolas Olivier (3 patents)Emmanuel Jean-Marc BeaurepaireDelphine Debarre (2 patents)Emmanuel Jean-Marc BeaurepaireJean-Louis Martin (2 patents)Emmanuel Jean-Marc BeaurepaireMathias Strupler (1 patent)Emmanuel Jean-Marc BeaurepaireIsraël Veilleux (2 patents)Emmanuel Jean-Marc BeaurepaireMarie-Claire Schanne-Klein (2 patents)Emmanuel Jean-Marc BeaurepairePierre Mahou (1 patent)Emmanuel Jean-Marc BeaurepaireDelphine Malvina Daniele Marie Debarre (1 patent)Emmanuel Jean-Marc BeaurepaireIsrael Veilleux (1 patent)Emmanuel Jean-Marc BeaurepaireDelphine Malvina Danièle Marie Debarre (0 patent)Emmanuel Jean-Marc BeaurepaireJean Louis Martin (0 patent)Emmanuel Jean-Marc BeaurepaireEmmanuel Jean-Marc Beaurepaire (3 patents)Nicolas OlivierNicolas Olivier (3 patents)Delphine DebarreDelphine Debarre (3 patents)Jean-Louis MartinJean-Louis Martin (3 patents)Mathias StruplerMathias Strupler (2 patents)Israël VeilleuxIsraël Veilleux (2 patents)Marie-Claire Schanne-KleinMarie-Claire Schanne-Klein (2 patents)Pierre MahouPierre Mahou (2 patents)Delphine Malvina Daniele Marie DebarreDelphine Malvina Daniele Marie Debarre (1 patent)Israel VeilleuxIsrael Veilleux (1 patent)Delphine Malvina Danièle Marie DebarreDelphine Malvina Danièle Marie Debarre (0 patent)Jean Louis MartinJean Louis Martin (0 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Ecole Polytechnique (3 from 140 patents)

2. Centre National De La Recherche Scientifique (1 from 5,076 patents)


3 patents:

1. 9791682 - Quantitative nonlinear optical microscopy using a shaped beam

2. 8284483 - Method and device for acquiring signals in laser scanning microscopy

3. 8227767 - Coherent nonlinear microscopy system and method with variation of the focal volume in order to probe the nanostructure of organized materials

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