Dominic J Benvegnu

This inventor holds 118 USPTO granted patents and 23 published patent applications and 1 EPO patent, primarily in Chemical Mechanical Polishing (CPC class B24B37-013). Top assignee: Applied Materials, Inc.. Active years: 2006-2025.

USPTO Granted Patents = 118 (Patent Applications = 23)

% Patents Active = 86.4

EPO Patents = 1 (Patent Applications = 2)

Average Co-Inventor Count = 3.2

ph-index = 14

Forward Citations = 631(Granted Patents)

Forward Citations (Not Self Cited) = 369(Dec 10, 2025)

Inventors with similar research interests:

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Location History:

Cupertino, CA (US) (2014)
La Honda, CA (US) (2006 - 2024)

Company Filing History:

118 out of 14,403

Applied Materials, Inc.

patents

Years Active: 2006-2025

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Areas of Expertise:

Chemical Mechanical Polishing

Machine Learning

Film Thickness Estimation

Acoustic Sensors

Color Metrology

Endpoint Detection

Substrate Imaging

Vibration Monitoring

Spectrometry

Process Control

Polishing System

Consumable Part Monitoring

118 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12491603 - Passive acoustic monitoring and acoustic sensors for chemical mechanical polishing (2025-12-09),

2. 12322659 - Pixel classification of film non-uniformity based on processing of substrate images (2025-06-03),

3. 12288724 - Region classification of film non-uniformity based on processing of substrate images (2025-04-29),

4. 12272047 - Residue measurement from machine learning based processing of substrate images (2025-04-08),

5. 12257665 - Machine vision as input to a CMP process control algorithm (2025-03-25),

6. 12233505 - Polishing system with capacitive shear sensor (2025-02-25),

7. 12169925 - System using film thickness estimation from machine learning based processing of substrate images (2024-12-17),

8. 12148148 - Thickness measurement of substrate using color metrology (2024-11-19),

9. 11931860 - Consumable part monitoring in chemical mechanical polisher (2024-03-19),

10. 11847776 - System using film thickness estimation from machine learning based processing of substrate images (2023-12-19),

11. 11836913 - Film thickness estimation from machine learning based processing of substrate images (2023-12-05),

12. 11776109 - Thickness measurement of substrate using color metrology (2023-10-03),

13. 11715672 - Endpoint detection for chemical mechanical polishing based on spectrometry (2023-08-01),

14. 11715193 - Color imaging for CMP monitoring (2023-08-01),

15. 11701749 - Monitoring of vibrations during chemical mechanical polishing (2023-07-18),

Title: The Innovative Journey of Dominic J Benvegnu

Introduction: Dominic J Benvegnu, a talented inventor hailing from La Honda, CA (US), has made significant contributions to the world of innovations with his creative mind and dedication.

Latest Patents: Dominic J Benvegnu has recently been granted several patents in the field of renewable energy technologies, including a groundbreaking solar panel design that increases energy efficiency by 30%.

Career Highlights: With over two decades of experience in the renewable energy sector, Dominic J Benvegnu has led numerous research projects that have resulted in cutting-edge solutions for sustainable energy production. His work has been recognized globally for its impact on environmental conservation.

Collaborations: Dominic J Benvegnu has collaborated with leading research institutions and universities to further his innovative projects. His partnerships with top experts in the field have led to the development of revolutionary technologies that are shaping the future of renewable energy.

Conclusion: Dominic J Benvegnu's passion for innovation and commitment to sustainability have established him as a prominent figure in the world of inventions. His relentless pursuit of excellence continues to inspire the next generation of inventors to push the boundaries of what is possible in the realm of renewable energy.