Company Filing History:
Years Active: 2018-2025
Title: The Innovative Contributions of Daniel Plohmann
Introduction
Daniel Plohmann is a notable inventor based in Lauingen, Germany. He has made significant contributions to the field of industrial metrology, particularly in the area of workpiece surface analysis. With a total of 3 patents to his name, Plohmann's work has advanced the methodologies used in precision measurement and surface property identification.
Latest Patents
Plohmann's latest patents include a method for generating a depth map of a workpiece surface based on a stack of images. This innovative method involves receiving images that capture a defined region of the surface at various focal plane positions. By determining focus values for each image point and fitting a function along the depth direction, Plohmann's method generates a depth map that accurately represents the surface's topography.
Another significant patent involves a method, computer program product, and measuring system for operating a triangulation laser scanner. This system is designed to identify surface properties of a workpiece using a CMOS sensor chip and a laser line light source. The data generated is analyzed to assess quality criteria, which can include barcode and texture information, enhancing the accuracy of surface measurements.
Career Highlights
Throughout his career, Daniel Plohmann has worked with esteemed companies such as Carl Zeiss Industrielle Messtechnik GmbH and Carl Zeiss Microscopy GmbH. His experience in these organizations has allowed him to refine his skills in industrial measurement technologies and contribute to cutting-edge innovations in the field.
Collaborations
Plohmann has collaborated with notable colleagues, including Tobias Held and Oliver Rettenmaier. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in measurement technology.
Conclusion
Daniel Plohmann's contributions to industrial metrology through his innovative patents and career achievements highlight his role as a significant figure in the field. His work continues to influence the methodologies used in surface measurement and analysis, showcasing the importance of innovation in technology.
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