The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Jul. 24, 2023
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Carl Zeiss Microscopy Gmbh, Jena, DE;
Sören Schmidt, Jena, DE;
Tomas Aidukas, Brugg, CH;
Dirk Seidel, Jena, DE;
Daniel Plohmann, Lauingen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A computer-implemented method includes receiving a focal image stack. The focal image stack includes multiple images of a measurement object. Each of the images captures a region of a surface of the measurement object with a defined focal plane position in a depth direction. The defined focal plane positions of the plurality of images are different from each other. The method includes generating an initial image with an extended depth of field in the depth direction based on the focal image stack. The method includes generating a corrected image by correcting a set of imaging errors in the initial image. The set of imaging errors includes a distortion error.