Sören Schmidt

Title: Sören Schmidt: Innovator in Industrial Metrology

Introduction

Sören Schmidt is a notable inventor based in Jena, Germany. He has made significant contributions to the field of industrial metrology, particularly in the area of workpiece surface analysis. His innovative approach has led to the development of a unique method for generating depth maps of workpiece surfaces.

Latest Patents

Sören Schmidt holds a patent for his invention titled "Industrial metrology of workpiece surface based on depth map." This method involves receiving a stack of images that capture a specific region of a workpiece's surface at various focal plane positions. Each image point is assigned to a corresponding object point on the surface, allowing for the determination of focus values. By fitting a function along the depth direction to these focus values, Schmidt's method enables the generation of a depth map based on the determined depth values. This innovative technique enhances the precision of surface measurements in industrial applications.

Career Highlights

Throughout his career, Sören Schmidt has worked with esteemed companies such as Carl Zeiss Industrielle Messtechnik GmbH and Carl Zeiss Microscopy GmbH. His experience in these organizations has allowed him to refine his skills and contribute to advancements in metrology and microscopy.

Collaborations

Sören Schmidt has collaborated with talented individuals in his field, including Tomas Aidukas and Daniel Plohmann. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Sören Schmidt's contributions to industrial metrology through his innovative patent demonstrate his expertise and commitment to advancing technology in this field. His work continues to influence the way surface measurements are conducted in various industrial applications.