The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Sep. 17, 2017
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
A method, a computer program product and a measuring system are provided for operating a triangulation laser scanner to identify surface properties of a workpiece. The scanner has a CMOS sensor chip, an imaging optical unit, and a laser line light source configured to generate a laser line on the workpiece in compliance with a Scheimpflug condition. Data generated on the sensor chip is reduced to an amount of data only including actual lateral positions of image points of the laser line and a quality criterion for each of the image points. The quality criterion is a measure of an intensity distribution along a direction transverse to a local direction of extent of the image points of the laser line on the sensor chip and the reduced amount of data is analyzed with respect to the quality criterion regarding a presence of barcode and/or detection code information and/or texture information.