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For the Inventor, By the Inventor

Kawasaki, Japan

Daisuke Fukuda

USPTO Granted Patents = 12 

Average Co-Inventor Count = 1.2

ph-index = 2

Forward Citations = 13(Granted Patents)


Location History:

  • Kawasaki, JP (2007 - 2014)
  • Setagaya, JP (2014 - 2023)

Company Filing History:

goldMedal12 out of 39,238 
 
Fujitsu Corporation
 patents

Years Active: 2007-2023

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12 patents (USPTO):Explore Patents
1. 11836580 - Machine learning method (2023-12-05),
2. 11829867 - Computer-readable recording medium and learning data generation method (2023-11-28),
3. 8856703 - Supporting device, design support method and computer-readable recording medium (2014-10-07),
4. 8667433 - Polishing estimation/evaluation device, overpolishing condition calculation device, and computer-readable non-transitory medium thereof (2014-03-04),
5. 8499259 - Polishing estimation/evaluation device, overpolishing condition calculation device, and computer-readable non-transitory medium thereof (2013-07-30),
6. 8356269 - Dummy-metal-layout evaluating device and dummy-metal-layout evaluating method (2013-01-15),
7. 8219375 - Plated film thickness calculating method and plated film thickness calculating device (2012-07-10),
8. 8104008 - Layout design apparatus, layout design method, and computer product (2012-01-24),
9. 8082536 - Semiconductor integrated circuit manufacturing process evaluation method (2011-12-20),
10. 7752579 - Film thickness predicting program, recording medium, film thickness predicting apparatus, and film thickness predicting method (2010-07-06),
11. 7406672 - Method and apparatus for constructing and optimizing a skew of a clock tree (2008-07-29),
12. 7289872 - Method and apparatus for prediction of polishing condition, and computer product (2007-10-30),
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