The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2012

Filed:

Aug. 03, 2009
Applicant:

Daisuke Fukuda, Kawasaki, JP;

Inventor:

Daisuke Fukuda, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer readable recording medium stores therein a plated film thickness calculating program for a semiconductor integrated circuit producing process in which a plating treatment, a polishing treatment and an over-polishing treatment are performed. The plated film thickness calculating program performing a process includes simulating the plating treatment of plating the surface of the substrate for a given thickness of the conductor; calculating a thickness of the conductor to be removed by the polishing treatment until at least a part of the plateaus appears; calculating a maximum thickness of the conductor to be remained on any part of the plateaus after performing the polishing treatment; and repeating the simulating, the thickness calculation and the maximum thickness calculation by changing the given thickness until a minimum of the given thickness is determined in which the maximum thickness of the remaining conductor becomes less than a predetermined level.


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