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For the Inventor, By the Inventor

Taipei, Taiwan

Chih-Peng Hsieh

This inventor holds 11 USPTO granted patents. Top assignee: Chunghwa Precision Test Tech. Co., Ltd.. Active years: 2018-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih-Peng Hsieh. Retrieved from https://idiyas.com/inventor/chih-peng-hsieh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 11

% Patents Active = 63.6

Average Co-Inventor Count = 1.9

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Taoyuan, TW (2018 - 2019)
  • Taipei, TW (2019 - 2021)

Company Filing History:

goldMedal11 out of 50 
 
Chunghwa Precision Test Tech. Co., Ltd.
 patents

Years Active: 2018-2021

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11 patents (USPTO):Explore Patents
1. 11041883 - Probe card device and rectangular probe thereof (2021-06-22),
2. 10901001 - Probe card device and probe head (2021-01-26),
3. 10670630 - Probe card device and rectangular probe (2020-06-02),
4. 10615768 - Probe assembly and capacitive space transformer thereof (2020-04-07),
5. 10613117 - Probe card device and rectangular probe thereof (2020-04-07),
6. 10605830 - Probe card device and rectangular probe thereof having ring-shaped branch segment (2020-03-31),
7. 10514390 - Probe structure (2019-12-24),
8. 10509057 - Probe assembly and probe structure thereof (2019-12-17),
9. 10401388 - Probe card device and rectangular probe thereof (2019-09-03),
10. 10317429 - Bolt type probe (2019-06-11),
11. 9970960 - Sliding rail type probe (2018-05-15),

Title: Innovations of Chih-Peng Hsieh in Probe Card Technology

Introduction

Chih-Peng Hsieh is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of probe card technology, holding a total of 11 patents. His innovative designs have advanced the capabilities of testing semiconductor devices.

Latest Patents

Among his latest patents is the "Probe card device and rectangular probe thereof." This invention features a probe card device that includes a first die, a second die, and multiple rectangular probes. Each probe consists of a middle segment, two extending segments, and two contact end segments. The design allows for enhanced conductivity and durability, with specific features such as a piercing portion that is partially embedded in the conductive portion. Another notable patent is the "Probe head," which includes a deformable segment arranged between the first and second dies. This design allows for a unique compression mechanism that enhances the performance of the probes during testing.

Career Highlights

Chih-Peng Hsieh is currently employed at Chunghwa Precision Test Tech Co., Ltd. His work at this company has been instrumental in developing advanced testing solutions for the semiconductor industry. His expertise in probe card technology has positioned him as a key figure in this specialized field.

Collaborations

Chih-Peng Hsieh has collaborated with notable coworkers such as Wei-Jhih Su and Yen-Chen Chen. Their combined efforts have contributed to the successful development of innovative testing technologies.

Conclusion

Chih-Peng Hsieh's contributions to probe card technology exemplify the impact of innovation in the semiconductor testing industry. His patents reflect a commitment to enhancing the efficiency and effectiveness of testing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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