Taipei, Taiwan

Chih-Peng Hsieh


Average Co-Inventor Count = 1.9

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Taoyuan, TW (2018 - 2019)
  • Taipei, TW (2019 - 2021)

Company Filing History:


Years Active: 2018-2021

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11 patents (USPTO):

Title: Innovations of Chih-Peng Hsieh in Probe Card Technology

Introduction

Chih-Peng Hsieh is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of probe card technology, holding a total of 11 patents. His innovative designs have advanced the capabilities of testing semiconductor devices.

Latest Patents

Among his latest patents is the "Probe card device and rectangular probe thereof." This invention features a probe card device that includes a first die, a second die, and multiple rectangular probes. Each probe consists of a middle segment, two extending segments, and two contact end segments. The design allows for enhanced conductivity and durability, with specific features such as a piercing portion that is partially embedded in the conductive portion. Another notable patent is the "Probe head," which includes a deformable segment arranged between the first and second dies. This design allows for a unique compression mechanism that enhances the performance of the probes during testing.

Career Highlights

Chih-Peng Hsieh is currently employed at Chunghwa Precision Test Tech Co., Ltd. His work at this company has been instrumental in developing advanced testing solutions for the semiconductor industry. His expertise in probe card technology has positioned him as a key figure in this specialized field.

Collaborations

Chih-Peng Hsieh has collaborated with notable coworkers such as Wei-Jhih Su and Yen-Chen Chen. Their combined efforts have contributed to the successful development of innovative testing technologies.

Conclusion

Chih-Peng Hsieh's contributions to probe card technology exemplify the impact of innovation in the semiconductor testing industry. His patents reflect a commitment to enhancing the efficiency and effectiveness of testing processes.

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