The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Mar. 20, 2018
Applicant:

Chunghwa Precision Test Tech. Co., Ltd., Taoyuan, TW;

Inventors:

Chih-Peng Hsieh, Taipei, TW;

Yen-Chen Chen, Taipei, TW;

Wei-Jhih Su, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 1/07307 (2013.01); G01R 1/0735 (2013.01); G01R 1/07314 (2013.01); G01R 1/07371 (2013.01); G01R 31/2601 (2013.01);
Abstract

A probe card device and a rectangular probe are provided. The rectangular probe includes a metallic pin, an insulating film, and an insulating latch. The metallic pin includes a connecting portion, a detecting portion, and a middle segment arranged between the connecting portion and the detecting portion. The insulating film covers entirely outer surfaces of the middle segment. The insulating latch is in a ring shape and is arranged around at least part of the insulating film. A bottom of the insulating latch is arranged adjacent to the detecting portion. A length of the insulating latch is less than or equal to that of the insulating film, and a thickness of the insulating latch is larger than that of the insulating film and is at least 10 μm.


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