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Taoyuan, Taiwan

Chunghwa Precision Test Tech. Co., Ltd.

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USPTO Granted Patents = 50

% Expired Patents = 12.0

Forward Citations = 37

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30 inventors (with patents filed for the assignee):

Wei-Jhih Su (31 out of 31 patents)

Kai-Chieh Hsieh (22 out of 22 patents)

Wen-Tsung Lee (15 out of 16 patents)

4. Chao-Hui Tseng (13 out of 13 patents)

5. Chih-Peng Hsieh (11 out of 11 patents)

6. Hao-Yen Cheng (9 out of 9 patents)

7. Hsun-Tai Wei (6 out of 6 patents)

8. Chao-Chiang Liu (6 out of 6 patents)

9. Rong-Yang Lai (6 out of 6 patents)

10. Vel Sankar Ramachandran (4 out of 4 patents)

11. Meng-Chieh Cheng (4 out of 4 patents)

12. Mei-Hui Chen (4 out of 4 patents)

13. Hsien-Yu Wang (3 out of 3 patents)

14. Yen-Chen Chen (3 out of 4 patents)

15. Hong-Ming Chen (3 out of 3 patents)

Core Competencies:

Probe Card

Cantilever Probe

Vertical Probe

Wafer Testing

Optoelectronic Circuit

Modular Design

High Speed Testing

Integrated Circuit

50 patents: Sort by Forward Citations

1. 12590994 - Cantilever probe card device and solder receiving probe (2026-03-31),

2. 12504465 - Test device for optoelectronic integrated circuit (2025-12-23),

3. 12467949 - Cantilever probe card device and light absorption probe (2025-11-11),

4. 12203961 - Vertical probe card device and fence-like probe thereof (2025-01-21),

5. 12181496 - Cantilever probe card and probe module thereof (2024-12-31),

6. 12146897 - Vertical probe card having different probes (2024-11-19),

7. 12111336 - Modular vertical probe card (2024-10-08),

8. 12092661 - Cantilever probe card device and elastic probe thereof (2024-09-17),

9. 11988686 - Vertical probe card and fence-like probe thereof (2024-05-21),

10. 11933817 - Probe card device and transmission structure (2024-03-19),

11. 11913973 - Cantilever probe card device and focusing probe thereof (2024-02-27),

12. 11879912 - Cantilever probe card and carrier thereof (2024-01-23),

13. 11747395 - Board-like connector, single-arm bridge of board-like connector, and wafer testing assembly (2023-09-05),

14. 11699871 - Board-like connector, dual-arm bridge of board-like connector, and wafer testing assembly (2023-07-11),

15. 11592466 - Probe card device and self-aligned probe (2023-02-28),

Company Overview

Chunghwa Precision Test Tech. Co., Ltd. is a leading provider of advanced probe card technology, specializing in the development and manufacturing of high-performance testing solutions for integrated circuits. The company focuses on various core technologies, including cantilever and vertical probes, wafer testing, and optoelectronic circuits. With a commitment to modular design and high-speed testing, Chunghwa Precision plays a crucial role in enhancing the efficiency and accuracy of semiconductor testing processes, primarily serving the global electronics industry from its headquarters in Taoyuan, Taiwan.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

50 Patents

#37 in Taoyuan

#403 in Taiwan

#14,024 in the World

Taoyuan, Taiwan

Chunghwa Precision Test Tech. Co., Ltd.

Forward Citations = 37

30 inventors:

Wei-Jhih Su (31 out of 31 patents)

Kai-Chieh Hsieh (22 out of 22 patents)

Wen-Tsung Lee (15 out of 16 patents)

4. Chao-Hui Tseng (13 out of 13 patents)

5. Chih-Peng Hsieh (11 out of 11 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Chunghwa Precision Test Tech. Co., Ltd.. Retrieved from https://idiyas.com/company/chunghwa-precision-test-tech-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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