The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2025

Filed:

Feb. 06, 2024
Applicant:

Chunghwa Precision Test Tech. Co., Ltd., Taoyuan, TW;

Inventors:

Jhih-Hong Cheng, Taoyuan, TW;

Hsin-Yao Lee, Taoyuan, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/07 (2006.01); G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2851 (2013.01); G01R 1/071 (2013.01); G02B 6/12004 (2013.01);
Abstract

A test device for an optoelectronic integrated circuit includes a circuit board, a connecting base, a first light transmission component, and a second light transmission component. The connecting base is arranged on the circuit board and includes a carrier board and a frame. The optoelectronic integrated circuit is arranged on a carrier surface of the carrier board. The first light transmission component is arranged on a side of the frame, includes a first transmission portion, and is located at a first vertical level with respect to the carrier surface. The second light transmission component is arranged on another side of the frame, includes a second transmission portion, and is located at a second vertical level with respect to the carrier surface. A height of the second vertical level is different from a height of the first vertical level.


Find Patent Forward Citations

Cheng, Jhih-Hong. (2025). Test device for optoelectronic integrated circuit (U.S. Patent No. 12504465). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12504465

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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