Taoyuan, Taiwan

Jhih-Hong Cheng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Chunghwa Precision Test Tech. Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jhih-Hong Cheng. Retrieved from https://idiyas.com/inventor/jhih-hong-cheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Jhih-Hong Cheng: Innovator in Optoelectronic Integrated Circuits

Introduction

Jhih-Hong Cheng is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of optoelectronic integrated circuits. His innovative work has led to the development of a unique test device that enhances the functionality and efficiency of these circuits.

Latest Patents

Jhih-Hong Cheng holds 1 patent for his invention titled "Test device for optoelectronic integrated circuit." This device comprises a circuit board, a connecting base, and two light transmission components. The design allows for effective testing of optoelectronic integrated circuits by utilizing a carrier board and a frame to support the components at different vertical levels.

Career Highlights

Cheng is currently employed at Chunghwa Precision Test Technology Co., Ltd. His role involves advancing technologies related to optoelectronic devices. His expertise in this area has positioned him as a key player in the development of innovative testing solutions.

Collaborations

Jhih-Hong Cheng collaborates with Hsin-Yao Lee, contributing to the advancement of their projects in optoelectronics. Their teamwork has fostered a productive environment for innovation.

Conclusion

Jhih-Hong Cheng's contributions to the field of optoelectronic integrated circuits exemplify the impact of innovative thinking in technology. His patent and ongoing work continue to influence advancements in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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