Taoyuan, Taiwan

Hao-Yen Cheng

This inventor holds 9 USPTO granted patents. Top assignee: Chunghwa Precision Test Tech. Co., Ltd.. Active years: 2024-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hao-Yen Cheng. Retrieved from https://idiyas.com/inventor/hao-yen-cheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2024-2025

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9 patents (USPTO):Explore Patents

Title: Innovations by Hao-Yen Cheng

Introduction

Hao-Yen Cheng is a prominent inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of testing technology, holding a total of 8 patents. His work focuses on developing advanced probe card devices that enhance testing efficiency and accuracy.

Latest Patents

One of his latest patents is the "Vertical probe card device and fence-like probe thereof." This invention features a fence-like probe with a length ranging from 5 mm to 8 mm. The design includes a fence-like segment, a connection segment, and a testing segment, with a penetrating slot that enhances its functionality. Another notable patent is the "Cantilever probe card and probe module thereof." This invention comprises a supporting board, a substrate, and multiple cantilever probes, allowing for fine adjustments to accommodate warpage differences during testing.

Career Highlights

Hao-Yen Cheng works at Chunghwa Precision Test Tech Co., Ltd., where he has been instrumental in advancing testing technologies. His innovative designs have positioned the company as a leader in the industry, contributing to improved testing methodologies.

Collaborations

He collaborates with talented coworkers such as Wei-Jhih Su and Chao-Hui Tseng, who contribute to the development of cutting-edge technologies in the field.

Conclusion

Hao-Yen Cheng's contributions to testing technology through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence advancements in probe card devices and testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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