The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 2021
Filed:
Mar. 20, 2019
Chunghwa Precision Test Tech. Co., Ltd., Taoyuan, TW;
Chih-Peng Hsieh, Taipei, TW;
Wei-Jhih Su, Taichung, TW;
CHUNGHWA PRECISION TEST TECH. CO., LTD., Taoyuan, TW;
Abstract
A probe head includes a first die, a second die, and a plurality of rectangular probes. Each rectangular probe includes a deformable segment arranged between the first and the second dies, a first positioned segment, and a second positioned segment, the latter two of which respectively extend from two opposite ends of the deformable segment and are respectively arranged in a first rectangular wall of the first die and a second rectangular wall of the second die. Each first rectangular wall and the corresponding second rectangular wall have a longitudinal offset and a width offset so as to press the first and second positioned segments of the corresponding rectangular probe, so that the deformable segment of the corresponding rectangular probe is compressed to be in a curved and deformed shape. A ratio of the longitudinal offset to the width offset is within a range of 10 to 1.