The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10401388 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 03, 2019

Filed:

Nov. 13, 2017
Applicant:

Chunghwa Precision Test Tech. Co., Ltd., Taoyuan, TW;

Inventors:

Wei-Jhih Su, Taichung, TW;

Chih-Peng Hsieh, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 1/067 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07328 (2013.01); G01R 1/06733 (2013.01); G01R 1/06755 (2013.01); G01R 1/07378 (2013.01);
Abstract

A rectangular probe of a probe card device includes a metallic pin and a metallic reinforcing body. The metallic pin includes a middle segment, a first connecting segment and a second connecting segment respectively extending from two opposite ends of the middle segment, a first contacting segment extending from the first connecting segment in a direction away from the middle segment, and a second contacting segment extending from the second connecting segment in a direction away from the middle segment. The metallic reinforcing body is integrally formed on the middle segment. The Young's modulus of the metallic reinforcing body is larger than that of the metallic pin. The electric conductivity of the metallic pin is larger than that of the metallic reinforcing body. An outside diameter jointly formed by the metallic reinforcing body and the middle segment is larger than an outside diameter of the second connecting segment.


Find Patent Forward Citations

Su, Wei-Jhih. (2019). Probe card device and rectangular probe thereof (U.S. Patent No. 10401388). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10401388

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…