Chih-Heng Fang

Title: Chih-Heng Fang: Innovator in Optical Inspection Technologies

Introduction

Chih-Heng Fang is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of optical inspection technologies, holding a total of 6 patents. His work focuses on developing advanced methods and systems for defect inspection, utilizing cutting-edge techniques in artificial intelligence.

Latest Patents

Among his latest patents are innovative solutions such as a defect inspection method, defect inspection device, and defect inspection system. One of his notable inventions involves an optical inspection method that utilizes an optical lens to obtain a first image of an object. This method includes performing edge detection on the first image to create a second image with an edge pattern. Furthermore, it employs a neural network architecture to conduct defect inspections on the second image, identifying any defect patterns present. Additionally, he has developed a defect inspection system that integrates with an automatic visual inspection device, enhancing the efficiency and accuracy of defect classification and verification processes.

Career Highlights

Chih-Heng Fang is currently associated with Utechzone Co., Ltd., where he continues to innovate in the field of optical inspection. His expertise and dedication to advancing technology have positioned him as a key figure in his industry.

Collaborations

He collaborates with talented individuals such as Arulmurugan Ambikapathi and Ming-Tang Hsu, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Chih-Heng Fang's contributions to optical inspection technologies demonstrate his commitment to advancing the field through innovative solutions. His patents reflect a deep understanding of both the technical and practical aspects of defect inspection, making him a valuable asset to Utechzone Co., Ltd. and the broader technological community.