The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Jun. 27, 2019
Utechzone Co., Ltd., New Taipei, TW;
Arulmurugan Ambikapathi, New Taipei, TW;
Ming-Tang Hsu, New Taipei, TW;
Chia-Liang Lu, New Taipei, TW;
Chih-Heng Fang, New Taipei, TW;
UTECHZONE CO., LTD., New Taipei, TW;
Abstract
An optical inspection method for an optical inspection device comprising an optical lens is provided according to an embodiment of the disclosure. The optical inspection method includes: obtaining a first image of an object by the optical lens; performing an edge detection on the first image to obtain a second image comprising an edge pattern; and performing a defect inspection operation on the second image based on a neural network architecture to inspect a defect pattern in the second image. In addition, an optical inspection device and an optical inspection system are provided according to embodiments of the disclosure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile