Taipei, Taiwan

Ming-Tang Hsu

This inventor holds 3 USPTO granted patents. Top assignee: Utechzone Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ming-Tang Hsu. Retrieved from https://idiyas.com/inventor/ming-tang-hsu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.3

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2021

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3 patents (USPTO):Explore Patents

Title: Innovations of Ming-Tang Hsu

Introduction

Ming-Tang Hsu is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of optical inspection technology. With a total of three patents to his name, Hsu's work focuses on enhancing defect inspection methods and systems.

Latest Patents

Hsu's latest patents include a defect inspection method, a defect inspection device, and a defect inspection system. The optical inspection method involves obtaining a first image of an object through an optical lens. It includes performing edge detection on the first image to create a second image with an edge pattern. A defect inspection operation is then conducted on the second image using a neural network architecture to identify any defect patterns. Additionally, his defect inspection system utilizes artificial intelligence to improve the accuracy of defect classification and verification.

Career Highlights

Ming-Tang Hsu is currently employed at Utechzone Co., Ltd., where he continues to innovate in the field of optical inspection. His work has been instrumental in developing advanced technologies that enhance the efficiency and effectiveness of defect detection processes.

Collaborations

Hsu collaborates with talented individuals such as Arulmurugan Ambikapathi and Chia-Liang Lu, contributing to a dynamic work environment that fosters innovation.

Conclusion

Ming-Tang Hsu's contributions to optical inspection technology through his patents and collaborative efforts highlight his role as a leading inventor in the field. His work continues to pave the way for advancements in defect inspection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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