The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Dec. 14, 2018
Applicant:

Utechzone Co., Ltd., New Taipei, TW;

Inventors:

Chih-Heng Fang, New Taipei, TW;

Chia-Liang Lu, New Taipei, TW;

Ming-Tang Hsu, New Taipei, TW;

Arulmurugan Ambikapathi, New Taipei, TW;

Chien-Chung Lin, New Taipei, TW;

Assignee:

UTECHZONE CO., LTD., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 3/08 (2006.01); G06N 5/04 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06N 3/0454 (2013.01); G06N 3/084 (2013.01); G06N 5/046 (2013.01); G06T 7/97 (2017.01); G06T 2207/20081 (2013.01);
Abstract

The present invention is an automated optical inspection method using deep learning, comprising the steps of: providing a plurality of paired image combinations, wherein each said paired image combination includes at least one defect-free image and at least one defect-containing image corresponding to the defect-free image; providing a convolutional neural network to start a training mode of the convolutional neural network; inputting the plurality of paired image combinations into the convolutional neural network, and adjusting a weight of at least one fully connected layer of the convolutional neural network through backpropagation to complete the training mode of the convolutional neural network; and performing an optical inspection process using the trained convolutional neural network.


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