The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Jun. 26, 2019
Utechzone Co., Ltd., New Taipei, TW;
Arulmurugan Ambikapathi, New Taipei, TW;
Ming-Tang Hsu, New Taipei, TW;
Chia-Liang Lu, New Taipei, TW;
Chih-Heng Fang, New Taipei, TW;
UTECHZONE CO., LTD., New Taipei, TW;
Abstract
A defect inspection system, connected to an automatic visual inspection device, is provided, including the followings. A re-inspection server (VRS) receives a defect image and a defect location. A training terminal stores trained modules. A classification terminal receives the defect image and the defect location, reads a target trained module corresponding to the defect image, classifies the defect image according to the target trained module to obtain a labeled defect image, and sends the labeled defect image to the VRS. A re-inspection terminal receives the labeled defect image from the VRS, and sends a verified operation corresponding to the labeled defect image to the VRS. A labeling re-inspection terminal receives the verified operation and the labeled defect image, and a labeling result corresponding to the labeled defect image. The VRS sends the labeling result and the labeled defect image to the training terminal to train a corresponding training module.