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Years Active: 2017-2022
Title: The Innovations of Chi-Hung Chan: A Journey of Ingenuity in Semiconductor Technology
Introduction: Chi-Hung Chan is an accomplished inventor based in Taichung, Taiwan, recognized for his contributions to semiconductor technology through his innovative patents. With a total of two patents to his name, he has made significant strides in improving measurement and inspection methodologies in the field.
Latest Patents: Chan's recent patents delve deep into enhancing the efficiency and accuracy of semiconductor processes. One of his notable inventions, the "Layout for Measuring Overlapping State," encompasses a sophisticated layout region that includes both a first dummy active area region and dummy component regions. This layout design helps in accurately measuring overlapping states, providing substantial improvements in semiconductor manufacturing.
Another significant patent by Chan is the "Test Structure for Electron Beam Inspection and Method for Defect Determination Using Electron Beam Inspection." This invention outlines a test structure that integrates a semiconductor substrate with conductive regions and a connection structure, along with a cap dielectric layer. The method he developed for defect determination using electron beam inspection enhances inspection accuracy through advanced signal monitoring techniques, showcasing his innovative approach to addressing challenges in semiconductor inspections.
Career Highlights: Throughout his career, Chi-Hung Chan has worked with esteemed companies in the semiconductor industry, including Winbond Electronics Corporation and United Microelectronics Corporation. His experience in these organizations has not only honed his technical skills but also contributed to his achievements as an inventor.
Collaborations: In his journey as an inventor, Chan has collaborated with talented professionals such as Chun-Chiao Tseng and Hung-Ming Su. These collaborations have played a crucial role in the development of his patents, reflecting the power of teamwork in driving innovation.
Conclusion: Chi-Hung Chan stands as a prominent figure in the realm of semiconductor innovation. His dedication to improving methodologies in measurement and inspection has significantly impacted the industry. With two patents showcasing his inventive spirit and collaborative nature, Chan continues to inspire current and future inventors striving to make their mark in technology.