Che-Lun Hung

Title: Che-Lun Hung: Innovator in Memory Array Technology

Introduction

Che-Lun Hung is a notable inventor based in Zhudong, Taiwan. He has made significant contributions to the field of memory array technology, holding a total of 2 patents. His work focuses on improving product yield and detecting manufacturing defects in memory arrays.

Latest Patents

Che-Lun Hung's latest patents include an "In-line inspection yield prediction system" and a "Test pattern for detecting piping in a memory array." The yield prediction system involves a method for predicting product yield by determining defect characteristics based on inspection data related to critical layers of the product. This method estimates product yield by assessing yield loss across these critical layers. The corresponding apparatus enhances the efficiency of the prediction process. The test pattern patent addresses manufacturing defects in memory arrays by defining active and grounded conductive members, along with an alternating arrangement of floating and grounded conductive members. This innovative approach aids in the detection of defects during the manufacturing process.

Career Highlights

Che-Lun Hung is currently employed at Macronix International Co., Ltd., where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise in memory array technology has positioned him as a key player in advancing the field.

Collaborations

He collaborates with talented coworkers, including Hsiang-Chou Liao and Tuung Luoh, contributing to a dynamic team focused on innovation and excellence in technology.

Conclusion

Che-Lun Hung's contributions to memory array technology through his patents and work at Macronix International Co., Ltd. highlight his role as an influential inventor in the industry. His innovative methods for yield prediction and defect detection are paving the way for advancements in semiconductor manufacturing.