The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 2013
Filed:
Sep. 01, 2010
Hsiang-chou Liao, Taipei, TW;
Che-lun Hung, Zhudong Township, Hsinchu County, TW;
Tuung Luoh, Taipei, TW;
Ling-wuu Yang, Hsinchu, TW;
Ta-hone Yang, Toufen Township, Miaoli County, TW;
Kuang-chao Chen, Taipei, TW;
Hsiang-Chou Liao, Taipei, TW;
Che-Lun Hung, Zhudong Township, Hsinchu County, TW;
Tuung Luoh, Taipei, TW;
Ling-Wuu Yang, Hsinchu, TW;
Ta-Hone Yang, Toufen Township, Miaoli County, TW;
Kuang-Chao Chen, Taipei, TW;
Macronix International Co., Ltd., Hsin-Chu, TW;
Abstract
A method of predicting product yield may include determining defect characteristics for a product based at least in part on inspection data associated with critical layers of the product, determining yield loss for each of the critical layers, and estimating product yield based on the determined yield loss of the critical layers. A corresponding apparatus is also provided.