Macronix International Co., Ltd.

Che-Lun Hung

Tuung Luoh

Hsiang-Chou Liao

Kuang-Chao Chen

Ling-Wuu Yang

Ling-Wu Yang

Ta-Hone Yang

A method of predicting product yield may include determining defect characteristics for a product based at least in part on inspection data associated with critical layers of the product, determining yield loss for each of the critical layers, and estimating product yield based on the determined yield loss of the critical layers. A corresponding apparatus is also provided.

In-line inspection yield prediction system

A method of detecting manufacturing defects at a memory array may include disposing an active area of a first width in communication with a first conductive member of the memory array to define a grounded conductive member, disposing an isolation structure of a second width in communication with a second conductive member of the memory array to define a floating conductive member, and providing an alternating arrangement of floating and grounded conductive members including arranging a plurality of the grounded and floating conductive members adjacent to each other to define a sequence of alternating floating and grounded conductive members. A corresponding test device is also provided.

Test pattern for detecting piping in a memory array

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Zhudong, Taiwan

Che-Lun Hung