The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 2012

Filed:

Sep. 28, 2010
Applicants:

Che-lun Hung, Hsinchu, TW;

Hsiang-chou Liao, Taipei, TW;

Tuung Luoh, Taipei, TW;

Ling-wu Yang, Hsinchu, TW;

Inventors:

Che-Lun Hung, Hsinchu, TW;

Hsiang-Chou Liao, Taipei, TW;

Tuung Luoh, Taipei, TW;

Ling-Wu Yang, Hsinchu, TW;

Assignee:

Macronix International Co., Ltd., Science Park, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting manufacturing defects at a memory array may include disposing an active area of a first width in communication with a first conductive member of the memory array to define a grounded conductive member, disposing an isolation structure of a second width in communication with a second conductive member of the memory array to define a floating conductive member, and providing an alternating arrangement of floating and grounded conductive members including arranging a plurality of the grounded and floating conductive members adjacent to each other to define a sequence of alternating floating and grounded conductive members. A corresponding test device is also provided.


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