Chang-Chun Xu

Title: Chang-Chun Xu: Innovator in Wafer Testing Technologies

Introduction

Chang-Chun Xu is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor testing, holding a total of 4 patents. His innovative approaches have advanced the methodologies used in wafer acceptance testing.

Latest Patents

Chang-Chun Xu's latest patents include a "Wafer acceptance test tool and test method using thereof." This method involves pressing probes against probe pads on a test line over a substrate to form first probe marks. It captures images of these marks and transmits them to an image inspection machine for analysis. The machine identifies the marks and determines their acceptability, leading to the execution of a first wafer acceptance test if the marks are deemed acceptable. Another notable patent is the "Probe card with angled probe and wafer testing method using the same." This invention features a probe card that includes a circuit board and a fixing member with multiple probes extending in a specific direction, enhancing the efficiency of wafer testing.

Career Highlights

Throughout his career, Chang-Chun Xu has worked with leading companies in the semiconductor industry, including Taiwan Semiconductor Manufacturing Company and TSMC China Company Limited. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies in wafer testing.

Collaborations

Chang-Chun Xu has collaborated with notable colleagues such as Ni Shen and Yuan-Chun Wu. Their teamwork has fostered innovation and development in the field of semiconductor testing.

Conclusion

Chang-Chun Xu's contributions to wafer testing technologies exemplify his dedication to innovation in the semiconductor industry. His patents reflect a commitment to improving testing methodologies, which are crucial for the advancement of technology.